Computer Graphics & A Study on Minimizing the Number of VDD/VSS Pins in Simultaneous Switching Environment 


Vol. 7,  No. 7, pp. 2179-2187, Jul.  2000
10.3745/KIPSTE.2000.7.7.2179


PDF
  Abstract

This paper provides a heuristic analysis technique which determines an optimal number of VDD/VSS pads meeting allowable Simultaneous Switching Noise(SSN) budget, early in the design phase. Until now, in determining the number of VDD/VSS pads, designers had to simulate packaging models case by case in the design phase or roughly allocate the power/ground pins in an inaccuate way according to typical design rules. However, due to the high density and frequency trends of IC technologies, the VDD/VSS pads allocation method can affect an adverse effect on IC operations, which requires more accurate and efficient methods be devised. Thus, this paper proposes an analytic VDD/VSS pads calculation method that gives a practical help for packaging designs early in the design phase. The proposed method is applied to a design example of a 1/8 × 208 pin plastic quad flat package(PQFP) and the results are verified through simulation using HSPICE.

  Statistics
  Cite this article

[IEEE Style]

Y. J. Bae, Y. O. Lee, J. H. Kim, B. G. Kim, "Computer Graphics & A Study on Minimizing the Number of VDD/VSS Pins in Simultaneous Switching Environment," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 7, no. 7, pp. 2179-2187, 2000. DOI: 10.3745/KIPSTE.2000.7.7.2179.

[ACM Style]

Yun Jeong Bae, Yun Ok Lee, Jae Ha Kim, and Byung Gi Kim. 2000. Computer Graphics & A Study on Minimizing the Number of VDD/VSS Pins in Simultaneous Switching Environment. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 7, 7, (2000), 2179-2187. DOI: 10.3745/KIPSTE.2000.7.7.2179.

Forms

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

Old Journals

Indexing

All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).

Related Journals