Design of the Memory Error Test Module at a Device Driver of the Linux 


Vol. 14,  No. 3, pp. 185-190, Jun.  2007
10.3745/KIPSTA.2007.14.3.185


PDF
  Abstract

The necessity of error test module is increasing as development of embedded Linux device driver. This paper proposes the basic concept of freed memory error test module in the Linux device driver and designs error test module. The USB device driver is designed for freed memory error test module. I insert the test code to verify the USB device driver. I test the suggested error test module for the USB storage device driver. I experiment error test in this module.

  Statistics
  Cite this article

[IEEE Style]

S. J. Jang, "Design of the Memory Error Test Module at a Device Driver of the Linux," The KIPS Transactions:PartA, vol. 14, no. 3, pp. 185-190, 2007. DOI: 10.3745/KIPSTA.2007.14.3.185.

[ACM Style]

Seung Ju Jang. 2007. Design of the Memory Error Test Module at a Device Driver of the Linux. The KIPS Transactions:PartA, 14, 3, (2007), 185-190. DOI: 10.3745/KIPSTA.2007.14.3.185.

Forms

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

Old Journals

Indexing

All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).

Related Journals