Test Suit Generation System for Retargetable C Compilers 


Vol. 16,  No. 4, pp. 245-254, Aug.  2009
10.3745/KIPSTA.2009.16.4.245


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  Abstract

With the increasing adoption of embedded processors, the need of developing compilers for the embedded processors with timely manner is also growing. Retargeting has been adopted as a viable approach to constructing new compilers by modifying the back-end of an existing compiler. This paper proposes a test suite generation system for testing retargetable C compilers. The proposed system generates the test suite using the grammar coverage concept. Generally, the size of the test suite satisfying the grammar coverage of the source language is very large. Hence, the proposed system also provides the facility to reduce the size of the test suite. According to the experimental result, the reduced test suite can detect 75% of the compiler faults detected by the original test suite though the size of the reduced test suite is only 10% of that of the original test suite in average. This result indicates that the reduction technique proposed in this paper can be effectively used in the prior phase of the development procedure of the embedded compilers.

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[IEEE Style]

G. Woo, J. H. Bae, H. I. Jang, Y. J. Lee, H. S. Chae, "Test Suit Generation System for Retargetable C Compilers," The KIPS Transactions:PartA, vol. 16, no. 4, pp. 245-254, 2009. DOI: 10.3745/KIPSTA.2009.16.4.245.

[ACM Style]

Gyun Woo, Jung Ho Bae, Han Il Jang, Yun Jung Lee, and Heung Seok Chae. 2009. Test Suit Generation System for Retargetable C Compilers. The KIPS Transactions:PartA, 16, 4, (2009), 245-254. DOI: 10.3745/KIPSTA.2009.16.4.245.

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