A Measurement Algorithm using Gray-level Thresholding in Automatic Refracto-Keratometer 


Vol. 9,  No. 6, pp. 727-734, Dec.  2002
10.3745/KIPSTB.2002.9.6.727


PDF
  Abstract

Currently, people become interested in the development of measuring instrument related to eyesight. In this study, we developed software of electronic part in automatic refracto-keratometer. If an automatic system, which uses images from an optical instrument, can inform the inspector of an accurate eyesight measured value after the internal process, the frequency of mistakenly observed value will be reduced considerably. This software is using morphological filtering and gray-level signal enhancing techniques. The morphological filtering is the first process, from images of the optical instrument, to transform an original image which is hard to process into manageable one. The second process is a signal enhancing technique to the first processed image using gray-level thresholding technique and is used to reduce an error caused by the variety in distribution of the gray value of image. Therefore, this software system in electronic part will make more effective eyesight measurement by reducing the error effectively when applied to the optical image which is difficult to get accurate measurement value.

  Statistics
  Cite this article

[IEEE Style]

W. Seong and J. W. Park, "A Measurement Algorithm using Gray-level Thresholding in Automatic Refracto-Keratometer," The KIPS Transactions:PartB , vol. 9, no. 6, pp. 727-734, 2002. DOI: 10.3745/KIPSTB.2002.9.6.727.

[ACM Style]

Won Seong and Jong Won Park. 2002. A Measurement Algorithm using Gray-level Thresholding in Automatic Refracto-Keratometer. The KIPS Transactions:PartB , 9, 6, (2002), 727-734. DOI: 10.3745/KIPSTB.2002.9.6.727.

Forms

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

Old Journals

Indexing

All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).

Related Journals