Contour-Based Partial Object Recognition Of Elliptical Objects Using Symmetry 


Vol. 13,  No. 2, pp. 115-120, Apr.  2006
10.3745/KIPSTB.2006.13.2.115


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  Abstract

In This Paper, We Propose The Method To Reconstruct And Estimate Partially Occluded Elliptical Objects In Images From Overlapping And Cutting. We Present The Robust Method For Recognizing Partially Occluded Objects Based On Symmetry Properties, Which Is Based On The Contours Of Elliptical Objects. A Proposed Method Provides Simple Techniques To Reconstruct Occluded Regions Via A Region Copy Using The Symmetry Axis Within An Object. Based On The Estimated Parameters For Partially Occluded Objects, We Perform Object Recognition On The Classifier. Since A Proposed Method Relies On Reconstruction Of The Object Based On The Symmetry Properties Rather Than Statistical Estimates, It Has Proven To Be Remarkably Robust In Recognizing Partially Occluded Objects In The Presence Of Scale Changes, Object Pose, And Rotated Objects With Occlusion, Even Though A Proposed Method Has Minor Limitations Of Object Poses.

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[IEEE Style]

J. S. Cho, "Contour-Based Partial Object Recognition Of Elliptical Objects Using Symmetry," The KIPS Transactions:PartB , vol. 13, no. 2, pp. 115-120, 2006. DOI: 10.3745/KIPSTB.2006.13.2.115.

[ACM Style]

June Suh Cho. 2006. Contour-Based Partial Object Recognition Of Elliptical Objects Using Symmetry. The KIPS Transactions:PartB , 13, 2, (2006), 115-120. DOI: 10.3745/KIPSTB.2006.13.2.115.

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