A Combination of Signature-based IDS and Machine Learning-based IDS using Alpha-cut and Beta pick
Vol. 12, No. 4, pp. 609-616, Aug. 2005
10.3745/KIPSTC.2005.12.4.609
Abstract
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Cite this article
[IEEE Style]
I. Y. Weon, D. H. Song, C. H. Lee, "A Combination of Signature-based IDS and Machine Learning-based IDS using Alpha-cut and Beta pick," The KIPS Transactions:PartC, vol. 12, no. 4, pp. 609-616, 2005. DOI: 10.3745/KIPSTC.2005.12.4.609.
[ACM Style]
Ill Young Weon, Doo Heon Song, and Chang Hoon Lee. 2005. A Combination of Signature-based IDS and Machine Learning-based IDS using Alpha-cut and Beta pick. The KIPS Transactions:PartC, 12, 4, (2005), 609-616. DOI: 10.3745/KIPSTC.2005.12.4.609.