A Method of Statistical Randomness Test for Key Derivation Functions 


Vol. 17,  No. 1, pp. 47-60, Feb.  2010
10.3745/KIPSTC.2010.17.1.47


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  Abstract

Randomness is a basic security evaluation item for the most cryptographic algorithms. NIST has proposed a statistical test suit for random number generators for cryptographic applications in the process of AES project. However the test suit of NIST is customized to block ciphers which have the same input and output lengths. It needs to revise NIST's test suit for key derivation functions which have multiple output blocks. In this paper we propose a revised method of NIST's statistical randomness test adequate to the most key derivation functions and some experimental results for key derivation functions of 3GSM and NIST.

  Statistics
  Cite this article

[IEEE Style]

J. S. Kang, O. Y. Yi, J. S. Youm, J. W. Cho, "A Method of Statistical Randomness Test for Key Derivation Functions," The KIPS Transactions:PartC, vol. 17, no. 1, pp. 47-60, 2010. DOI: 10.3745/KIPSTC.2010.17.1.47.

[ACM Style]

Ju Sung Kang, Ok Yeon Yi, Ji Sun Youm, and Jin Woong Cho. 2010. A Method of Statistical Randomness Test for Key Derivation Functions. The KIPS Transactions:PartC, 17, 1, (2010), 47-60. DOI: 10.3745/KIPSTC.2010.17.1.47.

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