A Test Case Generation Techniques Based on J2ME Platform
Vol. 13, No. 2, pp. 215-222, Apr. 2006
10.3745/KIPSTD.2006.13.2.215
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[IEEE Style]
S. I. Kim, M. K. Roh, S. Y. Rhew, "A Test Case Generation Techniques Based on J2ME Platform," The KIPS Transactions:PartD, vol. 13, no. 2, pp. 215-222, 2006. DOI: 10.3745/KIPSTD.2006.13.2.215.
[ACM Style]
Sang Il Kim, Myong Ki Roh, and Sung Yul Rhew. 2006. A Test Case Generation Techniques Based on J2ME Platform. The KIPS Transactions:PartD, 13, 2, (2006), 215-222. DOI: 10.3745/KIPSTD.2006.13.2.215.