Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT 


Vol. 16,  No. 3, pp. 371-380, Jun.  2009
10.3745/KIPSTD.2009.16.3.371


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  Abstract

Recently, lots of research on automated test data generation has been actively done. However, techniques for automated test data generation presented so far have been proved ineffective for programs with flag variables. It can present problems when considering embedded systems such as engine controllers that make extensive use of flag variables to record state information concerning devices. This paper introduces a technique for generating test data effectively for programs with flag variables. The presented technique transforms the test data generation problem into a SAT(SATisfiability) problem and makes advantage of SAT solvers for automated test data generation(ATDG). For the ends, we transform a program under test into Alloy which is the first-order relational logic and then produce test data via Alloy analyzer.

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[IEEE Style]

I. S. Chung, "Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT," The KIPS Transactions:PartD, vol. 16, no. 3, pp. 371-380, 2009. DOI: 10.3745/KIPSTD.2009.16.3.371.

[ACM Style]

In Sang Chung. 2009. Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT. The KIPS Transactions:PartD, 16, 3, (2009), 371-380. DOI: 10.3745/KIPSTD.2009.16.3.371.

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