Automated Black-Box Test Case Generation for MC/DC with SAT
Vol. 16, No. 6, pp. 911-920, Dec. 2009
10.3745/KIPSTD.2009.16.6.911
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[IEEE Style]
I. S. Chung, "Automated Black-Box Test Case Generation for MC/DC with SAT," The KIPS Transactions:PartD, vol. 16, no. 6, pp. 911-920, 2009. DOI: 10.3745/KIPSTD.2009.16.6.911.
[ACM Style]
In Sang Chung. 2009. Automated Black-Box Test Case Generation for MC/DC with SAT. The KIPS Transactions:PartD, 16, 6, (2009), 911-920. DOI: 10.3745/KIPSTD.2009.16.6.911.