Detection of Potential Memory Access Errors based on Assembly Codes
Vol. 18, No. 1, pp. 35-44, Feb. 2011
10.3745/KIPSTD.2011.18.1.35
Abstract
Statistics
|
Cite this article
[IEEE Style]
H. S. Kim, B. M. Kim, H. S. Bae, I. S. Chung, "Detection of Potential Memory Access Errors based on Assembly Codes," The KIPS Transactions:PartD, vol. 18, no. 1, pp. 35-44, 2011. DOI: 10.3745/KIPSTD.2011.18.1.35.
[ACM Style]
Hyun Soo Kim, Byeong Man Kim, Hyun Seop Bae, and In Sang Chung. 2011. Detection of Potential Memory Access Errors based on Assembly Codes. The KIPS Transactions:PartD, 18, 1, (2011), 35-44. DOI: 10.3745/KIPSTD.2011.18.1.35.