Digital Library[ Search Result ]

Search : "[ author: In Sang Chung ]" (6)
An automation method for GUI test using a UIA Library
Chang Min Choi   In Sang Chung   Hyeon Soo Kim
Vol. 18, No. 5, pp. 343-356, Oct. 2011
10.3745/KIPSTD.2011.18.5.343
Detection of Potential Memory Access Errors based on Assembly Codes
Hyun Soo Kim   Byeong Man Kim   Hyun Seop Bae   In Sang Chung
Vol. 18, No. 1, pp. 35-44, Feb. 2011
10.3745/KIPSTD.2011.18.1.35
Automated Test Data Generation for Testing Programs with Multi-Level Stack-directed Pointers
In Sang Chung
Vol. 17, No. 4, pp. 297-310, Aug. 2010
10.3745/KIPSTD.2010.17.4.297
Automated Black-Box Test Case Generation for MC/DC with SAT
In Sang Chung
Vol. 16, No. 6, pp. 911-920, Dec. 2009
10.3745/KIPSTD.2009.16.6.911
Automated Test Data Generation for Testing Programs with Flage Variables Based on SAT
In Sang Chung
Vol. 16, No. 3, pp. 371-380, Jun. 2009
10.3745/KIPSTD.2009.16.3.371
An Alloy Specification Based Automated Test Data Generation Technique
In Sang Chung
Vol. 14, No. 2, pp. 191-202, Apr. 2007
10.3745/KIPSTD.2007.14.2.191

Forms

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

Old Journals

Indexing

All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).

Related Journals