Digital Library[ Search Result ]
Search : "[ author: Ji Sun Youm ]" (1)
A Method of Statistical Randomness Test for Key Derivation Functions
Ju Sung Kang Ok Yeon Yi Ji Sun Youm Jin Woong Cho
Vol. 17, No. 1, pp. 47-60, Feb. 2010
10.3745/KIPSTC.2010.17.1.47
Vol. 17, No. 1, pp. 47-60, Feb. 2010

Submenu
POPULAR KEYWORDS
(TOP 10 KEYWORDS)
Recent Publications
(LAST 3 YEARS)
-
Vol. 14, 2025
-
Vol. 13, 2024
Old Journals
-
KTCCS (KIPS Transactions on Computer and Communication Systems)
-
KTSDE (KIPS Transactions on Software and Data Engineering)
-
The KIPS Transactions:PartA
(2001~2012) -
The KIPS Transactions:PartB
(2001~2012) -
The KIPS Transactions:PartC
(2001~2012) -
The KIPS Transactions:PartD
(2001~2012) -
The Transactions of the Korea Information Processing Society
(1994~2000)
Indexing
All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.







TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).