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Computer Graphics & Delay Fault Test Pattern Generator Using Indirect Implication Algorithms in Scan Environment
Kim Won Gi Kim Myoung Gyun Kang Sung Ho
Vol. 6, No. 6, pp. 1656-1666, Jun. 1999
10.3745/KIPSTE.1999.6.6.1656
Vol. 6, No. 6, pp. 1656-1666, Jun. 1999
10.3745/KIPSTE.1999.6.6.1656