Metrics Measuring a Quality based on Object - Oriented Design Characteristics
Vol. 7, No. 2, pp. 372-383, Feb. 2000
10.3745/KIPSTE.2000.7.2.372
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[IEEE Style]
Y. K. Kim and J. N. Park, "Metrics Measuring a Quality based on Object - Oriented Design Characteristics," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 7, no. 2, pp. 372-383, 2000. DOI: 10.3745/KIPSTE.2000.7.2.372.
[ACM Style]
Yu Kyong Kim and Jai Nyun Park. 2000. Metrics Measuring a Quality based on Object - Oriented Design Characteristics. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 7, 2, (2000), 372-383. DOI: 10.3745/KIPSTE.2000.7.2.372.