Template Check and Block Matching Method for Automatic Defects Detection of the Back Light Unit 


Vol. 13,  No. 4, pp. 377-382, Aug.  2006
10.3745/KIPSTB.2006.13.4.377


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  Abstract

In this paper, two methods based on the use of morphology and pattern matching prior to detect classified defects automatically on the back light unit which is a part of display equipments are proposed. One is the template check method which detects small size defects by using closing and opening method, and the other is the block matching method which detects big size defects by comparing with four regions of uniform blocks. The TC algorithm also can detect defects on the non-uniform pattern of BLU by using revised Otsu method. The proposed method has been implemented on the automatic defect detection system we developed and has been tested image data of BLU captured by the system.

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[IEEE Style]

C. H. Han, S. H. Cho, C. S. Oh, Y. K. Ryu, "Template Check and Block Matching Method for Automatic Defects Detection of the Back Light Unit," The KIPS Transactions:PartB , vol. 13, no. 4, pp. 377-382, 2006. DOI: 10.3745/KIPSTB.2006.13.4.377.

[ACM Style]

Chang Ho Han, Sang Hee Cho, Choon Suk Oh, and Young Kee Ryu. 2006. Template Check and Block Matching Method for Automatic Defects Detection of the Back Light Unit. The KIPS Transactions:PartB , 13, 4, (2006), 377-382. DOI: 10.3745/KIPSTB.2006.13.4.377.

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