The Optimal Threshold for ECN Marking
Vol. 12, No. 4, pp. 559-570, Aug. 2005
10.3745/KIPSTC.2005.12.4.559
Abstract
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[IEEE Style]
G. Y. Lee, J. G. Yim, I. H. Jang, "The Optimal Threshold for ECN Marking," The KIPS Transactions:PartC, vol. 12, no. 4, pp. 559-570, 2005. DOI: 10.3745/KIPSTC.2005.12.4.559.
[ACM Style]
Gye Young Lee, Jae Geol Yim, and Ik Hyeon Jang. 2005. The Optimal Threshold for ECN Marking. The KIPS Transactions:PartC, 12, 4, (2005), 559-570. DOI: 10.3745/KIPSTC.2005.12.4.559.