An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment 


Vol. 9,  No. 4, pp. 659-666, Aug.  2002
10.3745/KIPSTD.2002.9.4.659


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  Abstract

Park, Seo and Kim [12] developed the input domain-based SRGM, which was able to quantitatively assess the reliability of a software system during the testing and operational phases. They assumed perfect debugging during testing and debugging phase. To make this input domain-based SRGM more realistic, this assumption should be relaxed. In this paper we generalize the input domain-based SRGM under imperfect debugging. Then its statistical characteristics are investigated.

  Statistics


  Cite this article

[IEEE Style]

J. Y. Park, Y. S. Kim, Y. S. Hwang, "An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment," The KIPS Transactions:PartD, vol. 9, no. 4, pp. 659-666, 2002. DOI: 10.3745/KIPSTD.2002.9.4.659.

[ACM Style]

Joong Yang Park, Young Soon Kim, and Yang Sook Hwang. 2002. An Input Domain - Based Software Reliability Growth Model In Imperfect Debugging Environment. The KIPS Transactions:PartD, 9, 4, (2002), 659-666. DOI: 10.3745/KIPSTD.2002.9.4.659.