Application and Design of Metrics for Software Process Measurement 


Vol. 12,  No. 7, pp. 937-946, Dec.  2005
10.3745/KIPSTD.2005.12.7.937


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  Abstract

In the current marketplace, there are maturity models, standards, methodologies and guidelines that can help an organization improve the way it does business. All SPI models including ISO/IEC 15504 and CMMI provide the capability level of software process. However, most available improvement models focus on a specific goals and practices of the processes. So many assessors need an objective process measure how to estimate achievement of goals and practices. We proposed quantitative process capability metric (PCM) which can determine the degree of capability. And the effective measuring approach help SPI assessor as well as organization unit.

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[IEEE Style]

S. M. Hwang and H. G. Yeom, "Application and Design of Metrics for Software Process Measurement," The KIPS Transactions:PartD, vol. 12, no. 7, pp. 937-946, 2005. DOI: 10.3745/KIPSTD.2005.12.7.937.

[ACM Style]

Sun Myung Hwang and Hee Gyun Yeom. 2005. Application and Design of Metrics for Software Process Measurement. The KIPS Transactions:PartD, 12, 7, (2005), 937-946. DOI: 10.3745/KIPSTD.2005.12.7.937.

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