Design and Application of the TFM Based System Test Model for the Weapon System Embedded Software
Vol. 13, No. 7, pp. 923-930, Dec. 2006
10.3745/KIPSTD.2006.13.7.923
Abstract
Statistics
|
Cite this article
[IEEE Style]
J. H. Kim and H. B. Yoon, "Design and Application of the TFM Based System Test Model for the Weapon System Embedded Software," The KIPS Transactions:PartD, vol. 13, no. 7, pp. 923-930, 2006. DOI: 10.3745/KIPSTD.2006.13.7.923.
[ACM Style]
Jae Hwan Kim and Hee Byung Yoon. 2006. Design and Application of the TFM Based System Test Model for the Weapon System Embedded Software. The KIPS Transactions:PartD, 13, 7, (2006), 923-930. DOI: 10.3745/KIPSTD.2006.13.7.923.