A Formal Method on Conformance Testing for AIN Protocol Test Generation 


Vol. 4,  No. 2, pp. 552-562, Feb.  1997
10.3745/KIPSTE.1997.4.2.552


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  Abstract

This paper propses a formal method on conformance testing for INAP(AIN) test sequence generation by optimization technique. In order to implement and prove the effectiveness of the proposed method, we specify the SRSM of INAP protocol SRF in SDL and generate I/O FSM by using out S/W tool. We generate an optimal test sequence by applying our method to this reference I/S FSM. We prove experimentally that the length of the generated test sequence by our method is more effective and shorter(i.e., 31% improved)than the one generated by UIO method, and estimate that The test coverage space of our test sequence is larger that of UIO method.

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[IEEE Style]

K. S. Ki, K. S. Un, C. J. Yoon, "A Formal Method on Conformance Testing for AIN Protocol Test Generation," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 4, no. 2, pp. 552-562, 1997. DOI: 10.3745/KIPSTE.1997.4.2.552.

[ACM Style]

Kim Sang Ki, Kim Sung Un, and Chung Jae Yoon. 1997. A Formal Method on Conformance Testing for AIN Protocol Test Generation. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 4, 2, (1997), 552-562. DOI: 10.3745/KIPSTE.1997.4.2.552.

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