Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation 


Vol. 4,  No. 3, pp. 767-774, Mar.  1997
10.3745/KIPSTE.1997.4.3.767


PDF
  Abstract

A procedure presented in this paper generates test sequences to check the conformity of an implementation with a protocol specification, which is modeled as a deterministic finite state machine(FSM). We proposed a technique to determine a minimum-cost tour of the transition graph of the FSM. The technique using Multiple UIO and Shortest Path(MUSP) saves the cost 1~9% over MUIO and directly, derive a symmetric test graph from an FSM graph. From this fact, we proposed a technique using Multiple Unique State Signature(MUSS) to solve an open issue that the multiple UIO assignment may not minimize the length of the tour. In this paper, the proposed technique is, also, applied to generate a synchronizable test sequence. And the result shows that the technique using MUSP and MUSS saves the cost 7~29% and 7~42% over the previous approach using MUIO, respectively.

  Statistics
  Cite this article

[IEEE Style]

J. Y. Hee and H. B. Gee, "Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 4, no. 3, pp. 767-774, 1997. DOI: 10.3745/KIPSTE.1997.4.3.767.

[ACM Style]

Jung Yoon Hee and Hong Beum Gee. 1997. Techniques Using MUIO and Shortest Path ( MUSP ) and Multiple Unique State Signature ( MUSS ) for Synchronizable Test Sequence Generation. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 4, 3, (1997), 767-774. DOI: 10.3745/KIPSTE.1997.4.3.767.

Forms

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

Old Journals

Indexing

All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).

Related Journals