Description of Abstract Test Suite using TTCN
Vol. 5, No. 1, pp. 128-136, Jan. 1998
10.3745/KIPSTE.1998.5.1.128
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[IEEE Style]
P. Y. B and C. B. Moon, "Description of Abstract Test Suite using TTCN," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 1, pp. 128-136, 1998. DOI: 10.3745/KIPSTE.1998.5.1.128.
[ACM Style]
Park Young B and Chin Byoung Moon. 1998. Description of Abstract Test Suite using TTCN. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 1, (1998), 128-136. DOI: 10.3745/KIPSTE.1998.5.1.128.