A New IEEE Standard 1149.1 Backplane Test Extension for Multiple Board Accesses 


Vol. 5,  No. 2, pp. 558-571, Feb.  1998
10.3745/KIPSTE.1998.5.2.558


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  Abstract

The IEEE standard 1149.1, which was proposed to support to the test of elements within the boards, makes it possible to perform the bard level tests. But the problems of the system testing when the boards are equipped to the system, still remain. To solve theses problems, IEEE standard 1149.1 system backplane test extension was proposed. The traditional IEEE standard 1149.1 backplane test extension controls only one board at a time to shift the test data to the output cell. Therefore, the total test time increases because of the increase of the time required to shift the data. In this paper, we propose new IEEE standard 1149.1 backplane test protocol, in which two boards can be controlled by using a IEEE standard 1149.1 test bus at a time. By introducing the new protocol, the time required for the board tests can be greatly reduced since it is possible to shift the test data by accessing two boards at a time. And the Board Link Unit(BLU) port based on the new protocol can be implemented with the small number of transistors, so it is possible to perform the efficient board tests in system level with the small test costs.

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[IEEE Style]

Y. Y. Tae, K. H. Gyu, K. S. Ho, "A New IEEE Standard 1149.1 Backplane Test Extension for Multiple Board Accesses," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 5, no. 2, pp. 558-571, 1998. DOI: 10.3745/KIPSTE.1998.5.2.558.

[ACM Style]

Yim Yong Tae, Kim Hun Gyu, and Kang Sung Ho. 1998. A New IEEE Standard 1149.1 Backplane Test Extension for Multiple Board Accesses. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 5, 2, (1998), 558-571. DOI: 10.3745/KIPSTE.1998.5.2.558.

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