Digital Library[ Search Result ]

Search : "[ author: Jae Young Kim ]" (1)
Conformance Test Scenario Extraction Techniques for Embedded Software using Test Execution Time
In Su Park   Young Sul Shin   Sung Ho Ahn   Jin Sam Kim   Jae Young Kim  
Woo Jin Lee
Vol. 17, No. 2, pp. 147-156, Apr. 2010
10.3745/KIPSTD.2010.17.2.147

Forms

Search
(IN TITLE, AUTHOR, ABSTRACT,KEYWORDS)

Advanced Search ▼

POPULAR KEYWORDS
(TOP 10 KEYWORDS)

Recent Publications
(LAST 3 YEARS)

Old Journals

Indexing

All publications of TKIPS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.

TKIPS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).

Related Journals