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Bayesian Analysis ware Reliability Growth Model with Negative Binomial Information
Hee Cheul Kim Jong Goo Park Byoung Soo Lee
Vol. 7, No. 3, pp. 852-861, Mar. 2000
10.3745/KIPSTE.2000.7.3.852
Vol. 7, No. 3, pp. 852-861, Mar. 2000
10.3745/KIPSTE.2000.7.3.852