An Input Domain - Based Software Reliability Growth Model
Vol. 7, No. 11, pp. 3384-3393, Nov. 2000
                        
                            10.3745/KIPSTE.2000.7.11.3384
                    
                 
                        Abstract
                    
                 
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                    Cite this article
                [IEEE Style]
J. Y. Park, D. W. Seo, Y. S. Kim, "An Input Domain - Based Software Reliability Growth Model," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 7, no. 11, pp. 3384-3393, 2000. DOI: 10.3745/KIPSTE.2000.7.11.3384.
                    [ACM Style]
Joong Yang Park, Dong Woo Seo, and Young Soon Kim. 2000. An Input Domain - Based Software Reliability Growth Model. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 7, 11, (2000), 3384-3393. DOI: 10.3745/KIPSTE.2000.7.11.3384.
                    
                            
                    
                                Korean