An Input Domain - Based Software Reliability Growth Model
Vol. 7, No. 11, pp. 3384-3393, Nov. 2000
10.3745/KIPSTE.2000.7.11.3384
Abstract
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Cite this article
[IEEE Style]
J. Y. Park, D. W. Seo, Y. S. Kim, "An Input Domain - Based Software Reliability Growth Model," The Transactions of the Korea Information Processing Society (1994 ~ 2000), vol. 7, no. 11, pp. 3384-3393, 2000. DOI: 10.3745/KIPSTE.2000.7.11.3384.
[ACM Style]
Joong Yang Park, Dong Woo Seo, and Young Soon Kim. 2000. An Input Domain - Based Software Reliability Growth Model. The Transactions of the Korea Information Processing Society (1994 ~ 2000), 7, 11, (2000), 3384-3393. DOI: 10.3745/KIPSTE.2000.7.11.3384.

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