A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution 


Vol. 11,  No. 6, pp. 1287-1294, Oct.  2004
10.3745/KIPSTD.2004.11.6.1287


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  Abstract

Recently relationships between reliability measures and the coverage have been developed for evaluation of software reliability. Particularly the mean value function of the coverage-based software reliability growth model is important because of its key role in representing the software reliability growth. In this paper, we first review the problems of the existing mean value functions with respect to the assumptions on which they are based. Then a new mean value function is proposed. The new mean value function is developed for a general testing environment in which imperfect fault detection and repeated construct execution are allowed. Finally performance of the proposed model is empirically evaluated by applying it to a real data set.

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[IEEE Style]

J. Y. Park, J. H. Park, Y. S. Kim, "A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution," The KIPS Transactions:PartD, vol. 11, no. 6, pp. 1287-1294, 2004. DOI: 10.3745/KIPSTD.2004.11.6.1287.

[ACM Style]

Joong Yang Park, Jae Heung Park, and Young Soon Kim. 2004. A Coverage-Based Software Reliability Growth Model for Imperfect Fault Detection and Repeated Construct Execution. The KIPS Transactions:PartD, 11, 6, (2004), 1287-1294. DOI: 10.3745/KIPSTD.2004.11.6.1287.

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