Frequent Patterns Mining using only one-time Database Scan
Vol. 15, No. 1, pp. 15-30, Feb. 2008
10.3745/KIPSTD.2008.15.1.15
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Cite this article
[IEEE Style]
D. J. Chai, L. Jin, Y. M. Lee, B. H. Hwang, K. H. Ryu, "Frequent Patterns Mining using only one-time Database Scan," The KIPS Transactions:PartD, vol. 15, no. 1, pp. 15-30, 2008. DOI: 10.3745/KIPSTD.2008.15.1.15.
[ACM Style]
Duck Jin Chai, Long Jin, Yong Mi Lee, Bu Hyun Hwang, and Keun Ho Ryu. 2008. Frequent Patterns Mining using only one-time Database Scan. The KIPS Transactions:PartD, 15, 1, (2008), 15-30. DOI: 10.3745/KIPSTD.2008.15.1.15.